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Leland Coontz

from Orange, CA

Leland Coontz Phones & Addresses

  • 1601 Palmdale Ave, Orange, CA 92856 (714) 637-8156
  • 601 Palmdale Ave, Orange, CA 92865 (714) 637-8156
  • 2344 Oakmont Ave, Santa Ana, CA 92706 (714) 543-3686
  • Los Angeles, CA

Resumes

Resumes

Leland Coontz Photo 1

President

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Location:
2344 Oakmont Ave, Santa Ana, CA 92706
Industry:
Insurance
Work:
Leland Coontz
President
Skills:
Claim
Liability
Property Damage
Insurance
Claims Management
Property Claims
Xactimate
Large Loss
Commercial Insurance
Property and Casualty Insurance
Flood
Subrogation
Commercial Lines
Construction
Catastrophe
Adjustments
General Insurance
Legal Liability
Public Speaking
Loss Adjusting
Mold Remediation
Claims Handling
Water Damage
Insurance Adjusting
Restoration
Spanish
Reinsurance
Casualty
Workers Compensation
Claims
German
Estimating
Insurance Claims
Adjusting
Nfip Certified
International Trade
Iicrc Certified
Inland Marine
Claims Resolution
Litigation Management
Casualty Insurance
Adjusters
Interests:
Career
Boating
Collecting Antiques
Exercise
Electronics
Traveling
Outdoors
Reading
Sports
The Arts
Golf
Travel
Collecting
Languages:
English
German
Spanish
Leland Coontz Photo 2

Adjuster

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Location:
Santa Ana, CA
Industry:
Insurance
Work:
Leland Coontz
adjuster

Publications

Us Patents

Electrically Alterable Interconnection

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US Patent:
40927334, May 30, 1978
Filed:
May 7, 1976
Appl. No.:
5/684152
Inventors:
Leland I. Coontz - Orange CA
Morton H. Fox - Covina CA
Assignee:
McDonnell Douglas Corporation - Long Beach CA
International Classification:
G11C 506
G11C 2900
US Classification:
365200
Abstract:
An electrically alterable, non-volatile interconnect selectively connects and disconnects microcircuit elements formed on a wafer. The interconnect is formed on the same wafer as the microcircuit elements during the circuit fabrication process to permit electrically controlled reconfiguration of the microcircuit elements on the wafer. This enables wafer scale integration by permitting defective circuit elements to be bypassed and operable, redundant circuits to be substituted for them. MNOS memory transistors provide non-volatile storage of the chosen conductivity state of each interconnect, in the form of impedance differences. In a preferred embodiment, the impedance differences set a flip-flop whose output enables a gate. The gate may include amplification of the signals gated. In one phase of the cycle of operation, the chosen conductivity state of the interconnect may be read into the MNOS memory through the flip-flop.

Method For Providing Reconfigurable Microelectronic Circuit Devices And Products Produced Thereby

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US Patent:
39407403, Feb 24, 1976
Filed:
Jun 27, 1973
Appl. No.:
5/374242
Inventors:
Leland I. Coontz - Orange CA
Assignee:
Actron Industries, Inc. - Monrovia CA
International Classification:
H01L 2170
H01L 2700
US Classification:
340166R
Abstract:
The utility of microelectronic devices and the yield of a microelectronic fabricating process is increased by providing, in addition to the desired circuits, "redundant" circuits of the same type. Each circuit has included, in at least one access lead, a nonvolatile, electrically alterable semiconductor device, which can be "set" to either conduct or not conduct power to the circuit. During testing, only the desired number of devices are rendered accessible by "setting" the semiconductor device to conduct. A microelectronic device having repetitive rows and/or columns for memory cells or logical processors is provided with additional rows and columns. An electrically alterable device is placed in each row and column. Upon the successful test of each row, the row enabling device is set to a conductive state. Any row containing a defective device is not enabled.
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