US Patent:
20130064458, Mar 14, 2013
Inventors:
Justin David Silverman - Pacific Palisades CA, US
Adam Sean Jermyn - Longmeadow MA, US
Nina Markovic - Baltimore MD, US
Assignee:
THE JOHNS HOPKINS UNIVERSITY - Baltimore MD
International Classification:
G06K 9/46
G06K 9/40
B82Y 35/00
US Classification:
382199, 382264, 382190, 977742, 977842
Abstract:
An embodiment in accordance with the present invention provides a system and method for image analysis and processing. The present invention provides a software package for processing AFM data. More particularly it can be used for characterizing carbon nanotubes found within AFM images, though it does offer editing features that are general in nature. Its features are split amongst five menus, one button, and four data panels. The software package can be used to determine physical characteristics related to the imaged subject, such as, for instance length data for imaged carbon nanotubes.