US Patent:
20190033362, Jan 31, 2019
Inventors:
- Baden, CH
Arun Kadavelugu - Raleigh NC, US
Joonas Puukko - Helsinki, FI
Liming Liu - Cary NC, US
Jukka-Pekka Sjoroos - Espoo, FI
International Classification:
G01R 31/26
H01L 29/16
H01L 29/78
H03K 17/687
Abstract:
Unique systems, methods, techniques and apparatuses of semiconductor failure prognostication. One exemplary embodiment is a power converter comprising a semiconductor switch and a converter control system. The converter control system is configured to turn on the semiconductor switch, measure a first voltage and a current during reverse conduction, estimate junction temperature of the semiconductor device, turn off the semiconductor device, measure a second voltage after turning off the semiconductor device, determine a resistance value using the second voltage measurement, determine an expected resistance value, predict a failure of the semiconductor device using the resistance value and the expected resistance value, and transmit a semiconductor device failure warning.