Inventors:
Yongseon Koh - Palo Alto CA, US
Babak Matinpour - Sunnyvale CA, US
Vijaya Ceekala - San Jose CA, US
Assignee:
National Semiconductor Corporation - Santa Clara CA
International Classification:
G01R 31/3187
US Classification:
3247503, 32476301, 32476201, 324500, 327108, 327333
Abstract:
An analog device under test circuit and a built-in test circuit for testing an AC transfer characteristic of the analog device under test are fabricated on an integrated circuit. The built-in test circuit includes an amplitude detector that detects the amplitude of the output signal of the analog device under test. The test time is reduced by sampling in real-time the DC value corresponding to the amplitude of the analog device under test. An additional reduction in the test time is achieved by using comparators with upper and lower limit reference signals and a pass-fail logic test.