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Benjamin J Lau

from Fremont, CA
Age ~52
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Also known as:
Benjamin Joseph Lau, Jr Benny Lau, Benjamin Joseph, Benjamin J Liu, Benny Lau
Phone and address:
339 Ohlones St, Fremont, CA 94539
Related to:
Chaoyang Liu, 57
Connected to:
Ackerman Lau, 60Adrian T Lau, 44Aixa B Lau, 77Alixis D Lau, 84Amona R Lau, 69Arlene Lau, 66Armindo Lau, 39Arvid D Lau, 93Bowie B Lau, 55Brooke E Lau, 46

Benjamin Lau Phones & Addresses

  • 339 Ohlones St, Fremont, CA 94539
  • 4723 Amiens Ave, Fremont, CA 94555
  • San Ramon, CA
  • San Francisco, CA
  • Berkeley, CA
  • Alameda, CA
  • El Cerrito, CA

Work

Company: Medical Clinic-Rehabilitation Address: 4306 Geary Blvd Suite 201, San Francisco, CA 94118 Phones: (415) 876-6400

Education

School / High School: Albert Einstein College Of Medicine Of Yeshiva University 1993

Languages

English • Chinese, Cantonese

Awards

Healthgrades Honor Roll

Ranks

Certificate: Physical Medicine & Rehabilitation, 2009

Specialities

Physical Medicine & Rehabilitation

Professional Records

Medicine Doctors

Benjamin Lau Photo 1

Dr. Benjamin C Lau, San Francisco CA - MD (Doctor of Medicine)

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Specialties:
Physical Medicine & Rehabilitation
Address:
Medical Clinic-Rehabilitation
4306 Geary Blvd Suite 201, San Francisco, CA 94118
(415) 876-6400 (Phone)
Certifications:
Physical Medicine & Rehabilitation, 2009
Awards:
Healthgrades Honor Roll
Languages:
English
Chinese, Cantonese
Education:
Medical School
Albert Einstein College Of Medicine Of Yeshiva University
Graduated: 1993
Medical School
Montefiore Med Center
Graduated: 1994
Medical School
Uc Irvine Med Center
Graduated: 1998
Benjamin Lau Photo 2

Benjamin K. Lau

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Specialties:
Physical Medicine & Rehabilitation
Work:
Benjamin C K Lau Md Inc
4306 Geary Blvd STE 201, San Francisco, CA 94118
(415) 876-6400 (phone), (415) 876-6402 (fax)
Education:
Medical School
Albert Einstein College of Medicine at Yeshiva University
Graduated: 1993
Procedures:
Neurological Testing
Languages:
English
Description:
Dr. Lau graduated from the Albert Einstein College of Medicine at Yeshiva University in 1993. He works in San Francisco, CA and specializes in Physical Medicine & Rehabilitation.
Benjamin Lau Photo 3

Benjamin Ck Lau, San Francisco CA

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Specialties:
Physiatrist
Address:
4306 Geary Blvd, San Francisco, CA 94118
Education:
Yeshiva University, Albert Einstein College of Medicine - Doctor of Medicine
University of California-Irvine Medical Center - Residency - Physical Medicine and Rehabilitation
Board certifications:
American Board of Physical Medicine and Rehabilitation Certification in Physical Medicine and Rehabilitation

Lawyers & Attorneys

Benjamin Lau Photo 4

Benjamin K Lau - Lawyer

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Licenses:
Washington - Active 2010
Benjamin Lau Photo 5

Benjamin Lau - Lawyer

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Specialties:
Litigation
Personal Injury
Business
ISLN:
922120801
Admitted:
2010

Resumes

Resumes

Benjamin Lau Photo 6

Audit Manager At Macias Gini & O'connell Llp

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Location:
San Francisco Bay Area
Industry:
Accounting
Benjamin Lau Photo 7

Benjamin Lau

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Location:
San Francisco Bay Area
Industry:
Computer Software
Benjamin Lau Photo 8

Placement Director At Avtech Institute Of Technology

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Location:
United States
Benjamin Lau Photo 9

Benjamin Lau

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Location:
United States
Benjamin Lau Photo 10

Benjamin Lau

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Location:
United States

Business Records

Name / Title
Company / Classification
Phones & Addresses
Benjamin Lau
Principal
Pitco International Logistics
Freight Transportation Arrangement
484 Grandview Dr, South San Francisco, CA 94080
(650) 624-7337
Benjamin Lau
Principal, President
BEN LAU INSURANCE AGENCY, INC
Insurance Agent/Broker
2308 Clement St, San Francisco, CA 94121

Publications

Us Patents

Enhanced Method Of Testing Semiconductor Devices Having Nonvolatile Elements

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US Patent:
59826835, Nov 9, 1999
Filed:
Mar 23, 1998
Appl. No.:
9/046404
Inventors:
James A. Watson - Santa Clara CA
Fabiano Fontana - San Jose CA
Jenny Chui - Fremont CA
Steve Choi - San Jose CA
Benjamin Lau - South San Francisco CA
Assignee:
Advanced Micro Devices, Inc. - Sunnyvale CA
International Classification:
G11C 700
US Classification:
365201
Abstract:
An enhanced method of testing semiconductor devices having nonvolatile elements by determining regions of the semiconductor having differing orders of probability that a defect will occur. The enhanced method of testing includes testing of regions from the highest probability to the lowest probability of having a defect. Nonvolatile memory elements in the region being tested are placed in a high impedance state, bypass circuits in the region being tested are activated to bypass the nonvolatile memory elements that control the state of elements in the region being tested and test vectors are applied to the elements that are controlled by the bypassed nonvolatile memory elements. This procedure is repeated for the next untested region having the highest probability of having a defect until all regions have been tested.
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Benjamin J Lau from Fremont, CA, age ~52 Get Report