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Berg A Tehlirian

from Daly City, CA
Age ~54
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Also known as:
Berg Avedis Tehlirian, Berg Ara Tehlirian, Berg Living Tehlirian, Avedis Tehlirian
Phone and address:
286 Hampshire Ct, Daly City, CA 94015
(650) 754-0366
Related to:
Est Avedis TehlirianRaymond R Boughton, 68Avedis TehlirianAra A Tehlirian, 56Rosalie A TehlirianChristine A Tehlirian, 58
Connected to:
Bonnie J Tehoke, 91Chris O Tehoke, 44Steve W Tehoke, 93Emilia D Tehonica, 45Camilo A Tehortua, 40Arash A Tehranchi, 48Audrey J Tehrani, 102Claudia E Tehrani, 60Dawood F Tehrani, 61Deborah T Tehrani, 55

Berg Tehlirian Phones & Addresses

  • 286 Hampshire Ct, Daly City, CA 94015 (650) 754-0366
  • San Francisco, CA
  • San Mateo, CA
  • Santa Margarita, CA
  • Fresno, CA
  • Kerman, CA

Resumes

Resumes

Berg Tehlirian Photo 1

Director, Research And Development

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Location:
San Francisco, CA
Industry:
Biotechnology
Work:
Thermo Fisher Scientific since 2006
Engineering Manager
Thermo Fisher Scientific 2003 - 2006
Program Manager, Ion Trap Development
Thermo Fisher Scientific 1996 - 2002
Mechanical Engineer
Ultra Fab Technology 1994 - 1995
Project Manager/Mechanical Engineer
Brady Engineering 1989 - 1993
Engineering Assistant
Education:
San Jose State University 1988 - 1993
Massachusetts Institute of Technology
Stanford University
Skills:
R&D
Engineering
Engineering Management
Product Development
Validation
Design For Manufacturing
Medical Devices
Lifesciences
Cross Functional Team Leadership
Project Planning
Berg Tehlirian Photo 2

Berg Tehlirian

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Business Records

Name / Title
Company / Classification
Phones & Addresses
Berg Tehlirian
Gough & Fell, LLC
Real Estate Property Management, Rental, · Nonclassifiable Establishments
286 Hampshire Ct, Daly City, CA 94015
Berg Tehlirian
Abt San Francisco, LLC
Real Estate Property Management Rental &
286 Hampshire Ct, Daly City, CA 94015
Berg Tehlirian
Abt Peninsula, LLC
Real Estate Property Management Rental & · Real Property Management · Business Services at Non-Commercial Site
286 Hampshire Ct, Daly City, CA 94015

Publications

Us Patents

Integrated Shield In Multipole Rod Assemblies For Mass Spectrometers

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US Patent:
6936815, Aug 30, 2005
Filed:
Jun 5, 2003
Appl. No.:
10/456894
Inventors:
Berg A. Tehlirian - Daly City CA, US
Michael W. Senko - Sunnyvale CA, US
Nigel P. Gore - San Jose CA, US
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
H01J049/00
B01D059/44
US Classification:
250292, 250290
Abstract:
Multipole rod assemblies for guiding or trapping ions in a mass spectrometer. A multipole rod assembly includes a plurality of modules. Each module includes a shield element, one or more insulating elements coupled to the shield element, and one or more multipole rods mounted on the insulating elements, wherein the modules are coupled together to form the multipole rod assembly such that the multipole rods of the modules define an interior volume for guiding or trapping ions.

Linear Multipole Rod Assembly For Mass Spectrometers

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US Patent:
6441370, Aug 27, 2002
Filed:
Apr 11, 2000
Appl. No.:
09/546748
Inventors:
Mukul Khosla - San Jose CA
Berg Tehlirian - Daly City CA
Assignee:
Thermo Finnigan LLC - San Jose CA
International Classification:
H01J 4942
US Classification:
250292, 250293, 250290
Abstract:
A multiple-pole electrode assembly is disclosed for use in mass spectrometers or other applications such as ion traps or ion guides. The disclosed apparatus provides a rod mounting and connection assembly in which equally spaced rectangular rods are embedded in spaced, dimensionally stable insulating materials. This structure is more conveniently and inexpensively manufactured than previously available multiple pole electrode assemblies.

Ion-To-Electron Conversion Dynode For Ion Imaging Applications

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US Patent:
20210035789, Feb 4, 2021
Filed:
Jul 28, 2020
Appl. No.:
16/941124
Inventors:
- San Jose CA, US
Alan E. SCHOEN - Kilauea HI, US
Johnathan W. SMITH - Round Rock TX, US
Berg A. TEHLIRIAN - Daly City CA, US
International Classification:
H01J 43/24
H01J 49/02
Abstract:
A metal-channel conversion dynode comprises: a wafer comprising a first face and a second face parallel to the first face and having a thickness less than 1000 μm; and a plurality of channels passing through the wafer from the first face to the second face at an angle to a plane of the first face and a plane of the second face. In some embodiments, each inter-channel distance may be substantially the same as the wafer thickness. In some embodiments, the wafer is fabricated from tungsten. In some other embodiments, the wafer comprises a non-electrically conductive material that is fabricated by three-dimensional (3D) printing or other means and that is coated, on its faces and within its channels, with a metal or suitably conductive coating that produces secondary electrons upon impact by either positive or negative ions.

Blood Sample Analysis Systems And Methods

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US Patent:
20200141920, May 7, 2020
Filed:
Nov 6, 2018
Appl. No.:
16/181849
Inventors:
- San Jose CA, US
Jae C. SCHWARTZ - Gilroy CA, US
Berg A. TEHLIRIAN - Daly City CA, US
International Classification:
G01N 33/49
G01N 21/47
H01J 49/04
H01J 49/00
Abstract:
A system includes an optical measurement unit that measures an optical property of a whole blood sample deposited on a surface of a substrate, an ion source that causes ions derived from the whole blood sample, including ions formed from an analyte of interest present in the whole blood sample, to be emitted from the substrate, a mass analyzer that receives the ions emitted from the substrate and measures an abundance of at least one ion species corresponding to the analyte of interest, and at least one computing device that determines, based on the measured optical property, a hematocrit of the whole blood sample, and determines, based on the determined hematocrit of the whole blood sample and the measured abundance of the at least one ion species, a concentration of the analyte of interest per unit volume of blood plasma.

Identifying The Occurrence And Location Of Charging In The Ion Path Of A Mass Spectrometer

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US Patent:
20140264007, Sep 18, 2014
Filed:
Mar 17, 2014
Appl. No.:
14/216507
Inventors:
- San Jose CA, US
Michael W. SENKO - Sunnyvale CA, US
Michael W. BELFORD - Los Altos CA, US
Jae C. SCHWARTZ - Gilroy CA, US
Jean-Jacques DUNYACH - San Jose CA, US
Berg TEHLIRIAN - Daly City CA, US
Assignee:
THERMO FINNIGAN LLC - San Jose CA
International Classification:
H01J 49/00
US Classification:
250282, 250288
Abstract:
A method is described for identifying the occurrence and location of charging of ion optic devices arranged along the ion path of a mass spectrometer. The method includes repeatedly performing a sequence of introducing a beam of discharge ions to a location on the ion path, and subsequently measuring the intensities of opposite-polarity sample ions delivered to a mass analyzer, with the discharge ions being delivered to a location further downstream in the ion path at each successive sequence.
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Berg A Tehlirian from Daly City, CA, age ~54 Get Report