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Cheryl J Ajluni

from Morgan Hill, CA
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Connected to:
David Ajluni, 74Isa N Ajluni, 84Jonathan Ajluni, 28Sreedhar Ajma, 38Chaudhry Ajmal, 76Fareeha Ajmal, 44Mo Ajmal, 46Sharif Ajmal, 34Zazai Ajmal, 33Mohamed Y Ajmalkhan, 43

Cheryl Ajluni Phones & Addresses

  • 285 Cosmo Ave, Morgan Hill, CA 95037 (408) 776-0924 (408) 776-0923
  • 285 Cosmo Ave, Morgan Hill, CA 95037

Work

Company: Penton media Apr 2015 to Jul 2016 Position: Content creation project manager, lead writer

Education

Degree: Bachelors, Bachelor of Science School / High School: University of California, Davis 1987 to 1990 Specialities: Mathematics, Physics

Skills

Product Marketing • Marketing Communications • Press Releases • Social Media • Technical Writing • Magazine Articles • Editorial • Copy Editing • Editing • Content Management • Media Relations • Advertising • Public Relations • Copywriting • Web Content • Content Development • Publishing • Web Content Management • Corporate Communications • Books • Publications • Magazines • Blogging • Content Strategy • Published Author • Newsletters • Journalism • Proofreading • Internal Communications • Strategic Communications • Publicity • News Writing • Digital Media • Email Marketing • Online Publishing • New Media • Creative Writing • Seo • White Papers • Social Networking • Social Media Marketing • Online Marketing • Proposal Writing • Crisis Communications • Marketing • Search Engine Optimization • Writing

Emails

c***[email protected]

Industries

Electrical/Electronic Manufacturing

Resumes

Resumes

Cheryl Ajluni Photo 1

Director, Eisg And Software Solutions

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Location:
285 Cosmo Ave, Morgan Hill, CA 95037
Industry:
Electrical/Electronic Manufacturing
Work:
Penton Media Apr 2015 - Jul 2016
Content Creation Project Manager, Lead Writer
Reed Business Information 2006 - 2011
Contributing Editor, Podcast and Webinar Moderator
Wired Island 2006 - 2008
Freelance Technical Writer
Penton Media 1994 - 2004
Editor In Chief, Wireless Systems Design
Keysight Technologies 1994 - 2004
Director, Eisg and Software Solutions
Education:
University of California, Davis 1987 - 1990
Bachelors, Bachelor of Science, Mathematics, Physics
Skills:
Product Marketing
Marketing Communications
Press Releases
Social Media
Technical Writing
Magazine Articles
Editorial
Copy Editing
Editing
Content Management
Media Relations
Advertising
Public Relations
Copywriting
Web Content
Content Development
Publishing
Web Content Management
Corporate Communications
Books
Publications
Magazines
Blogging
Content Strategy
Published Author
Newsletters
Journalism
Proofreading
Internal Communications
Strategic Communications
Publicity
News Writing
Digital Media
Email Marketing
Online Publishing
New Media
Creative Writing
Seo
White Papers
Social Networking
Social Media Marketing
Online Marketing
Proposal Writing
Crisis Communications
Marketing
Search Engine Optimization
Writing

Publications

Us Patents

Optical Illumination And Inspection System For Wafer And Solar Cell Defects

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US Patent:
53348443, Aug 2, 1994
Filed:
Apr 5, 1993
Appl. No.:
8/042890
Inventors:
Howard E. Pollard - Saratoga CA
Robert E. Neff - Fremont CA
Cheryl J. Ajluni - San Jose CA
Assignee:
Space Systems/Loral, Inc. - Palo Alto CA
International Classification:
G01N 2147
US Classification:
250330
Abstract:
An optical inspection system for detecting cracks in a crystalline substrate. The crystalline substrate that is to be inspected is located in a test plane in the field of view of a video camera. A first collimated light source projects light which is passed through a long pass filter. The filtered collimated light is projected onto the reflective surface of a panel that contains surface irregularities in the same order as the wavelength of the filtered, collimated light. The light is diffused by the panel surface and reflected onto the crystalline substrate at a plurality of various angles. The light passes through the crystalline substrate and is reflected into the path of the field of view of the video camera and forms an object image from which a real image is created and may be viewed on a control monitor. Cracks in the solar cell silicon layer or glass covers can be observed on the control monitor, and printed by a video graphics printer or stored via a VCR for permanent documentation purposes.

Isbn (Books And Publications)

Forging Consensus: --the Inside Story of the Development of IEEE 802.11

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Author

Cheryl J. Ajluni

ISBN #

0738147710

RF Circuit Design

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Author

Cheryl J. Ajluni

ISBN #

0750685182

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Cheryl J Ajluni from Morgan Hill, CA Get Report