Inventors:
Sharad Saxena - Richardson TX, US
Carlo Guardiani - San Jose CA, US
Philip D. Schumaker - Austin TX, US
Patrick D. McNamara - San Jose CA, US
Dale Coder - Sunnyvale CA, US
Assignee:
PDF Solutions, Inc. - San Jose CA
International Classification:
G06G007/48
US Classification:
703 4, 703 2, 703 3, 700 26, 700 28, 700 31, 700 32, 716 4
Abstract:
A computer implemented method for statistical modeling and simulation of the impact of global variation and local mismatch on the performance of integrated circuits, comprises the steps of: estimating a representation of component mismatch from device performance measurements in a form suitable for circuit simulation; reducing the complexity of statistical simulation by performing a first level principal component or principal factor decomposition of global variation, including screening; further reducing the complexity of statistical simulation by performing a second level principal component decomposition including screening for each factor retained in the first level principal component decomposition step to represent local mismatch; and performing statistical simulation with the joint representation of global variation and local mismatch obtained in the second level principal component decomposition step.