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Elena Stoyanova Eneva

from Sunnyvale, CA
Age ~47

Elena Eneva Phones & Addresses

  • 799 W Washington Ave, Sunnyvale, CA 94086
  • 500 Middlefield Rd, Mountain View, CA 94043
  • Sewanee, TN
  • 831 Huntington Dr, Arcadia, CA 91007 (626) 447-2465
  • Mount Kisco, NY
  • Pittsburgh, PA
  • Evanston, IL
  • Pasadena, CA

Resumes

Resumes

Elena Eneva Photo 1

Research Scientist - Artificial Intelligence

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Location:
799 west Washington Ave, Sunnyvale, CA 94086
Industry:
Information Services
Work:
Data Science For Social Good at University of Chicago
Director

Data Science For Social Good University of Chicago Jun 2013 - Aug 2013
Data Science Mentor

Accenture Jun 2013 - Aug 2013
Data Scientist - Senior Manager

Accenture Jun 2013 - Aug 2013
Research Scientist - Artificial Intelligence

Elena Eneva &Co May 2008 - Jun 2010
Adventure World Traveler and Volunteer
Education:
Carnegie Mellon University 2000 - 2002
Master of Science, Masters, Mining
The University of the South 1996 - 2000
Bachelors, Bachelor of Arts, Computer Science
First English Language School 1992 - 1996
Skills:
Data Mining
Machine Learning
Big Data
Analytics
Statistics
Computer Science
Data Analysis
Predictive Analytics
Databases
Text Mining
Natural Language Processing
Software Engineering
Algorithms
Perl
Predictive Modeling
Agile Methodologies
Information Retrieval
Fraud Detection
Data Visualization
Interests:
Civil Rights and Social Action
Environment
Science and Technology
Disaster and Humanitarian Relief
Health
Languages:
English
French
Russian
Bulgarian
Elena Eneva Photo 2

Elena Eneva

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Business Records

Name / Title
Company / Classification
Phones & Addresses
Elena Eneva
CTO
Overture Services, Inc
Telephone Communications Information Retrieval Services · Telephone Communication, Except Radio
74 N Pasadena Ave, Pasadena, CA 91103
3333 W Empire Ave, Burbank, CA 91504
(626) 685-5600, (626) 229-5242, (626) 440-0462, (626) 229-5395

Publications

Us Patents

Evaluating Performance Of Binary Classification Systems

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US Patent:
20080148106, Jun 19, 2008
Filed:
Dec 18, 2006
Appl. No.:
11/612004
Inventors:
Richard Tao-Hwa Chow - Sunnyvale CA, US
Pavel Berkhin - Sunnyvale CA, US
Elena Eneva - Mountain View CA, US
Boris Klots - Belmont CA, US
Nicolas Eddy Mayoraz - Cupertino CA, US
Rajesh Girish Parekh - Mountain View CA, US
Assignee:
YAHOO! INC. - Sunnyvale CA
International Classification:
G06F 11/00
G06Q 10/00
US Classification:
714 49, 705 7, 714E1102
Abstract:
Methods and apparatus are described for evaluating a binary classification system operable to classify each of a plurality of events as a first event type or a second event type. At least some of the events of the first event type are independently verifiable with reference to verification data. The binary classification system is susceptible to a first error type in which events of the first event type are classified as the second event type, and a second error type in which events of the second event type are classified as the first event type. Operation of a first configuration of the binary classification system is evaluated with reference to an objective function. The objective function is derived by expressing a number of errors of the second error type in terms of a number of errors of the first error type with reference to the verification data, and by assuming relative proportions of the first and second event types within the plurality of events.

Evaluating Performance Of Binary Classification Systems

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US Patent:
20140006145, Jan 2, 2014
Filed:
Sep 5, 2013
Appl. No.:
14/018873
Inventors:
Pavel Berkhin - Sunnyvale CA, US
Elena Eneva - Mountain View CA, US
Boris Klots - Belmont CA, US
Nicolas Eddy Mayoraz - Cupertino CA, US
Rajesh Girish Parekh - San Jose CA, US
Assignee:
Yahoo! Inc. - Sunnyvale CA
International Classification:
G06Q 30/02
US Classification:
705 1447
Abstract:
Methods and apparatus are described for evaluating a binary classification system operable to classify each of a plurality of events as a first event type or a second event type. At least some of the events of the first event type are independently verifiable with reference to verification data. The binary classification system is susceptible to a first error type in which events of the first event type are classified as the second event type, and a second error type in which events of the second event type are classified as the first event type. Operation of a first configuration of the binary classification system is evaluated with reference to an objective function. The objective function is derived by expressing a number of errors of the second error type in terms of a number of errors of the first error type with reference to the verification data, and by assuming relative proportions of the first and second event types within the plurality of events.
Elena Stoyanova Eneva from Sunnyvale, CA, age ~47 Get Report