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John Sidorowich Phones & Addresses

  • Mifflinburg, PA
  • Halifax, PA
  • South Kent, CT
  • 150 Thayer Rd, Santa Cruz, CA 95060 (831) 423-2279
  • Bonny Doon, CA
  • Aptos, CA
  • Los Alamos, NM
  • San Diego, CA
  • PO Box 231, South Kent, CT 06785

Work

Position: Sales Occupations

Education

Degree: High school graduate or higher

Publications

Us Patents

Method And Apparatus For Multidomain Data Analysis

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US Patent:
6532076, Mar 11, 2003
Filed:
Apr 4, 2000
Appl. No.:
09/542724
Inventors:
John J. Sidorowich - Santa Cruz CA
Assignee:
Therma-Wave, Inc. - Fremont CA
International Classification:
G01B 1128
US Classification:
356630, 382141, 382145
Abstract:
An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local âgenesâ represent parameters that are associated with only one domain, while global genes represent parameters that are associated with multiple domains. A processor evolves models for the data associated with each domain, which models are compared to the measured data, and a âbest fitâ solution is provided as the result. Each model of theoretical data is represented by an underlying âgenotypeâ which is an ordered set of the genes. For each domain a âpopulationâ of genotypes is evolved through the use of a genetic algorithm. The global genes are allowed to âmigrateâ among multiple domains during the evolution process.

Method And Apparatus For Multidomain Data Analysis

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US Patent:
6781706, Aug 24, 2004
Filed:
Jan 22, 2003
Appl. No.:
10/349262
Inventors:
John J. Sidorowich - Santa Cruz CA
Assignee:
Therma-Wave, Inc. - Fremont CA
International Classification:
G01B 1128
US Classification:
356630, 382141
Abstract:
An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local âgenesâ represent parameters that are associated with only one domain, while global genes represent parameters that are associated with multiple domains. A processor evolves models for the data associated with each domain, which models are compared to the measured data, and a âbest fitâ solution is provided as the result. Each model of theoretical data is represented by an underlying âgenotypeâ which is an ordered set of the genes. For each domain a âpopulationâ of genotypes is evolved through the use of a genetic algorithm. The global genes are allowed to âmigrateâ among multiple domains during the evolution process.

Method And Apparatus For Multidomain Data Analysis

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US Patent:
7050179, May 23, 2006
Filed:
Mar 2, 2004
Appl. No.:
10/791256
Inventors:
John J. Sidorowich - Santa Cruz CA, US
Assignee:
Therma-Wave, Inc. - Fremont CA
International Classification:
G01B 11/28
G06K 9/00
US Classification:
356630, 382141, 382145, 706 13
Abstract:
An optical measuring device generates a plurality of measured optical data from inspection of a thin film stack. The measured optical data group naturally into several domains. In turn the thin film parameters associated with the data fall into two categories: local and global. Local “genes” represent parameters that are associated with only one domain, while global genes represent parameters that are associated with multiple domains. A processor evolves models for the data associated with each domain, which models are compared to the measured data, and a “best fit” solution is provided as the result. Each model of theoretical data is represented by an underlying “genotype” which is an ordered set of the genes. For each domain a “population” of genotypes is evolved through the use of a genetic algorithm. The global genes are allowed to “migrate” among multiple domains during the evolution process.

Identifying Clusters Of Words According To Word Affinities

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US Patent:
8108392, Jan 31, 2012
Filed:
Oct 1, 2008
Appl. No.:
12/242957
Inventors:
David L. Marvit - San Francisco CA, US
Jawahar Jain - Los Altos CA, US
Stergios Stergiou - Sunnyvale CA, US
Alex Gilman - Fremont CA, US
B. Thomas Adler - Santa Cruz CA, US
John J. Sidorowich - Santa Cruz CA, US
Assignee:
Fujitsu Limited - Kawasaki
International Classification:
G06F 17/30
US Classification:
707737, 704 9
Abstract:
In one embodiment, identifying clusters of words includes accessing a record that records affinities. An affinity between a first and second word describes a quantitative relationship between the first and second word. Clusters of words are identified according to the affinities. A cluster comprises words that are sufficiently affine with each other. A first word is sufficiently affine with a second word if the affinity between the first and second word satisfies one or more affinity criteria. A clustering analysis is performed using the clusters.

Selecting Tags For A Document By Analyzing Paragraphs Of The Document

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US Patent:
8280892, Oct 2, 2012
Filed:
Oct 1, 2008
Appl. No.:
12/242984
Inventors:
David L. Marvit - San Francisco CA, US
Jawahar Jain - Los Altos CA, US
Stergios Stergiou - Sunnyvale CA, US
Alex Gilman - Fremont CA, US
B. Thomas Adler - Santa Cruz CA, US
John J. Sidorowich - Santa Cruz CA, US
Yannis Labrou - Washington DC, US
Assignee:
Fujitsu Limited - Kawasaki-shi
International Classification:
G06F 17/30
US Classification:
707749, 704 9
Abstract:
In one embodiment, assigning tags to a document includes accessing the document, where the document comprises text units that include words. The following is performed for each text unit: a subset of words of a text unit is selected as candidate tags, relatedness is established among the candidate tags, and certain candidate tags are selected according to the established relatedness to yield a candidate tag set for the text unit. Relatedness between the candidate tags of each candidate tag set and the candidate tags of other candidate tag sets is determined. At least one candidate tag is assigned to the document according to the determined relatedness.

Recommending Terms To Specify Ontology Space

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US Patent:
20090094020, Apr 9, 2009
Filed:
Oct 1, 2008
Appl. No.:
12/243050
Inventors:
David L. Marvit - San Francisco CA, US
Jawahar Jain - Los Altos CA, US
Stergios Stergiou - Sunnyvale CA, US
Alex Gilman - Fremont CA, US
B. Thomas Adler - Santa Cruz CA, US
John J. Sidorowich - Santa Cruz CA, US
Albert Reinhardt - Albany CA, US
Yannis Labrou - Washington DC, US
Assignee:
Fujitsu Limited - Kanagawa
International Classification:
G06F 17/27
G06F 17/30
US Classification:
704 9, 707 5, 704E15018, 707E17015
Abstract:
In one embodiment, a set of target search terms for a search is received. Candidate terms are selected, where a candidate term is selected to reduce an ontology space of the search. The candidate terms are to a computer to recommend the candidate terms as search terms. In another embodiment, a document stored in one or more tangible media is accessed. A set of target tags for the document is received. Terms are selected, where a term is selected to reduce an ontology space of the document. The terms are sent to a computer to recommend the terms as tags.

Modeling Topics Using Statistical Distributions

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US Patent:
20090094233, Apr 9, 2009
Filed:
Oct 1, 2008
Appl. No.:
12/243267
Inventors:
David L. Marvit - San Francisco CA, US
Jawahar Jain - Los Altos CA, US
Stergios Stergiou - Sunnyvale CA, US
Alex Gilman - Fremont CA, US
B. Thomas Adler - Santa Cruz CA, US
John J. Sidorowich - Santa Cruz CA, US
Yannis Labrou - Washington DC, US
Assignee:
Fujitsu Limited - Kanagawa
International Classification:
G06F 17/30
US Classification:
707 5, 707E17001
Abstract:
In one embodiment, modeling topics includes accessing a corpus comprising documents that include words. Words of a document are selected as keywords of the document. The documents are clustered according to the keywords to yield clusters, where each cluster corresponds to a topic. A statistical distribution is generated for a cluster from words of the documents of the cluster. A topic is modeled using the statistical distribution generated for the cluster corresponding to the topic.

Method And Apparatus For Optical Data Analysis

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US Patent:
58646337, Jan 26, 1999
Filed:
May 17, 1996
Appl. No.:
8/649576
Inventors:
Jon Opsal - Livermore CA
John J. Sidorowich - Aptos CA
Assignee:
Therma-Wave, Inc. - Fremont CA
International Classification:
G06K 900
G06F 1518
US Classification:
382141
Abstract:
An optical inspection device generates a plurality of measured optical data from inspection of a thin film stack. A processor evolves models of theoretical data, which are compared to the measured data, and a "best fit" solution is provided as the result. Each model of theoretical data is represented by an underlying "genotype" which is an ordered list of "genes. " Each gene corresponds to a selected thin film parameter of interest. Many such individual genotypes are created thereby forming a "population" of genotypes, which are evolved through the use of a genetic algorithm. Each genotype has a fitness associated therewith based on how much the theoretical data derived therefrom differs from the measured data. Individual genotypes are selected based on fitness, then a genetic operation is performed on the selected genotypes to produce new genotypes. Multiple generations of genotypes are evolved until an acceptable solution is obtained.
John J Sidorowich from Mifflinburg, PA, age ~65 Get Report