Resumes
Resumes
Nandakumar Krishnan Phones & Addresses
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952 Covington Rd, Los Altos, CA 94024
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Sunnyvale, CA
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Mountain View, CA
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5618 Stevens Creek Blvd, Cupertino, CA 95014 (408) 865-1984
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San Jose, CA
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Santa Clara, CA
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Cleveland, OH
Publications
Us Patents
In Situ And Real Time Monitoring Of Interconnect Reliability Using A Programmable Device
View pageUS Patent:
20100207649, Aug 19, 2010
Filed:
Feb 13, 2009
Appl. No.:
12/370607
Inventors:
Nandakumar Krishnan - San Jose CA, US
Xinli Gu - San Jose CA, US
Li Li - San Jose CA, US
Jie Xue - San Jose CA, US
Jonathan M. Parlan - San Jose CA, US
Xinli Gu - San Jose CA, US
Li Li - San Jose CA, US
Jie Xue - San Jose CA, US
Jonathan M. Parlan - San Jose CA, US
International Classification:
G01R 31/02
US Classification:
324754
Abstract:
In one embodiment, the reliability of the L2 power and/or ground sub-arrays of contacts of a functional integrated circuit device is verified by applying a reference voltage to a selected contact in sub-array and sequentially measuring the voltage at other contacts in the sub-array. If the voltage levels are greater than a threshold voltage level then the functional integrated circuit device is verified as being reliable.