Michael George Glavicic

20140074410, Mar 13, 2014

Feb 17, 2012

14/000054

Michael G. Glavicic - Indianapolis IN, US
Jason A. Gilbert - Ione CA, US

Rolls-Royce Corporation - Indianapolis IN

G01N 29/11

702 39

A system may include a data analysis device that is configured to receive from an ultrasonic waveform detector ultrasonic waveform data representative of an ultrasonic waveform that propagated through a sample and resonated within a defect within the sample. The data analysis device may be further configured to select a portion of the ultrasonic waveform data, apply a Fast Fourier Transform to the portion of the ultrasonic waveform data to transform the portion from a time domain to a frequency domain, identify a characteristic frequency of the portion in the frequency domain, and determine a characteristic of the defect based on the characteristic frequency of the portion. In some examples, the characteristic of the defect may be at least one of an approximate size or an approximate shape of the defect.

7978821, Jul 12, 2011

Feb 13, 2009

12/370987

Michael G. Glavicic - Indianapolis IN, US
Pamela A. Kobryn - Westerville OH, US

The United States of America as represented by the Secretary of the Air Force - Washington DC

G01N 23/203

378 76

A device for measuring crystal orientation with an x-ray source using the Laue method and includes an apparatus for mapping a polycrystalline surface having a grain orientation. The apparatus including an x-ray source creating an x-ray beam, the beam having polychromatic photons, the beam collimated to a point on the polycrystalline surface. A two-dimensional x-ray detector with an aperture, the x-ray beam passing through the aperture, the detector detecting and collecting polychromatic photons diffracted from the polycrystalline surface and onto the detector. A means for moving the polycrystalline surface with respect to the x-ray source to collect a plurality of diffracted x-rays which define a Laue pattern. A data processing means to collect Laue patterns of the polycrystalline surface based upon the plurality of diffracted x-rays, the Laue patterns identifying a plurality of crystallographic orientations and a plurality of grain surface areas on the polycrystalline surface.

20200251290, Aug 6, 2020

Apr 20, 2020

16/853219

- Indianapolis IN, US
Michael George Glavicic - Avon IN, US

H01G 11/24
G01N 27/22
H01L 51/00
G01R 27/26
H05K 1/03
C08J 5/06
C08J 5/04

A system may include a controller configured to cause a capacitance probe to subject a material to a first electric signal having a first frequency and determine a first capacitance of the material at the first frequency. The controller is configured to cause the capacitance probe to subject the material to a second electric signal at a second frequency and determine a second capacitance of the material at the second frequency. The material includes at least a first constituent phase and a second constituent phase. The first constituent phase and the second constituent phase have substantially similar dielectric constants at the first frequency and substantially different dielectric constants at the second frequency. The controller is further configured to determine a porosity of the material based on the first capacitance and determine a relative phase composition of the first constituent phase and the second constituent phase based on the second capacitance.

20190197677, Jun 27, 2019

Dec 18, 2018

16/223503

- Indianapolis IN, US
Kong Ma - Carmel IN, US
Joseph Peter Henderkott - Westfield IN, US
Michael George Glavicic - Avon IN, US

G06T 7/00
G05B 17/02
G06T 15/08

The disclosure describes a method by a controller that includes: executing a model of a material based on a geometric template of the material defined by geometric parameters and at least one geometric constraint of the material; determining a value of an objective function based on differences between a three-dimensional representation of the material based on measurements of the material and the model of the material based on the geometric template of the material; and determining updated values of the geometric parameters of the geometric template. The method further includes iterating the executing the model of the material, the determining the value of the objective function, and the determining the updated values of the geometric parameters until a parameter associated with the objective function satisfies a criterion and, outputting the updated values of the geometric parameters associated with the objective function that satisfies the criterion.

20190094161, Mar 28, 2019

Sep 24, 2018

16/139901

- Indianapolis IN, US
Michael George Glavicic - Avon IN, US

G01N 23/207
G01N 23/20
G01N 23/201

A system includes a focusing system, a radiation detector, and a controller. The focusing system is configured to receive an incident radiation beam from a radiation source and focus the incident radiation beam on a portion of a component of a high temperature mechanical system. The incident radiation beam scatters from the portion of the component as a diffracted radiation beam. The focusing system is further configured to focus the diffracted radiation beam from the portion of the component on the radiation detector. The radiation detector is configured to detect a diffraction pattern of the diffracted radiation beam from the portion of the component. The controller is configured to determine a temperature of the portion of the component based on the diffraction pattern.

20180233298, Aug 16, 2018

Feb 14, 2018

15/897094

- Indianapolis IN, US
Michael George Glavicic - Indianapolis IN, US

H01G 11/24
C08J 5/04
H05K 1/03
C08J 5/06
H01L 51/00
G01R 27/26

A system may include a controller configured to cause a capacitance probe to subject a material to a first electric signal having a first frequency and determine a first capacitance of the material at the first frequency. The controller is configured to cause the capacitance probe to subject the material to a second electric signal at a second frequency and determine a second capacitance of the material at the second frequency. The material includes at least a first constituent phase and a second constituent phase. The first constituent phase and the second constituent phase have substantially similar dielectric constants at the first frequency and substantially different dielectric constants at the second frequency. The controller is further configured to determine a porosity of the material based on the first capacitance and determine a relative phase composition of the first constituent phase and the second constituent phase based on the second capacitance.

20180080450, Mar 22, 2018

Sep 19, 2016

15/269540

- Indianapolis IN, US
Michael G. Glavicic - Indianapolis IN, US

F04D 19/00
F04D 29/38
F04D 29/32

A fan for a turbofan engine includes a plurality of blades and a disk, the plurality of blades constructed of an anisotropic material, the anisotropic material is a plate, sheet, or forging. A first blade type has a first crystallographic texture and a first natural frequency, and a second blade type has a second crystallographic texture and a second natural frequency. The first natural frequency is at least 4% greater than the second natural frequency, and the first blade type and the second blade type are attached to the disk in an alternating pattern to provide a flutter damping effect. The fan blades may be cut from a plate of the anisotropic material along orthogonal directions or forged from round bar oriented along a first direction and a second orthogonal direction, respectively.

20160168680, Jun 16, 2016

Dec 9, 2015

14/964180

- Indianapolis IN, US
Michael George Glavicic - Indianapolis IN, US

C22F 1/18
C22C 14/00
C22F 1/00

A method includes heating an initial titanium alloy comprising a duplex microstructure at a first solution temperature that is below a phase transition temperature of the alloy. Substantially all secondary alpha phase domains may dissolve during the heating. The method also includes cooling the initial titanium alloy at a first cooling rate to form a recrystallized annealed titanium alloy comprising primary alpha phase domains. The method further includes heating the recrystallized annealed titanium alloy to a second solution temperature that is below the phase transition temperature of the alloy. The method additionally includes cooling the recrystallized annealed titanium alloy at a second cooling rate to form a treated titanium alloy comprising the duplex microstructure. The second cooling rate is different than the first cooling rate. A distribution of crystallographic orientations of primary alpha phase domains in the treated titanium alloy may be different than in the initial titanium alloy.