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Michael D Uchic

from Dayton, OH
Age ~54
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Also known as:
Michael David Uchic, Machael D Uchic, Mike D Uchic
Phone and address:
6319 Rosa Linda Dr, Dayton, OH 45459
(937) 291-0553
Related to:
Marie E Uchic, 83John T Uchic, 81Merrilyn A Fedder, 82Sarah A Uchic, 55Grace E UchicElmer Louis Fedder, 94Andrew A Fedder, 53
Connected to:
Chihiro Uchida, 42Fumitake Uchida, 42Isao Uchida, 88Kazami P Uchida, 57Mitsuhiro Uchida, 57Ralph K Uchida, 71Renee K Uchida, 42Ryuji Uchida, 38Shigehiro Uchida, 70Shizue Uchida, 46

Michael Uchic Phones & Addresses

  • 6319 Rosa Linda Dr, Dayton, OH 45459 (937) 291-0553
  • 580 Littlebury Ln, Dayton, OH 45458 (937) 291-0553
  • Centerville, OH
  • Gurnee, IL
  • Palo Alto, CA
  • 612 Cambridge Ave, Menlo Park, CA 94025 (650) 326-9201
  • Bellbrook, OH

Resumes

Resumes

Michael Uchic Photo 1

Engineer At United States Air Force

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Location:
P/O Box 369024, Columbus, OH
Industry:
Logistics And Supply Chain
Work:
United States Air Force
Engineer at United States Air Force
Skills:
Logistics
Air Force
Supply Chain
Michael Uchic Photo 2

Michael Uchic

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Publications

Us Patents

Apparatus And Method For Material Testing Of Microscale And Nanoscale Samples

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US Patent:
7752916, Jul 13, 2010
Filed:
Aug 31, 2007
Appl. No.:
11/897927
Inventors:
Jong H. Han - Pataskala OH, US
M. Taher A. Saif - Champaign IL, US
Michael D. Uchic - Dayton OH, US
Assignee:
The Board of Trustees of the University of Illinois - Urbana IL
International Classification:
G01D 1/16
G01L 7/00
US Classification:
73789, 73856
Abstract:
Methods and apparatus for testing a microscale or nanoscale sample. A testing stage comprises a frame having first and second laterally opposing ends and first and second side beams. At least one deformable force sensor beam is disposed near the first opposing end and extends laterally between the first and second side beams. A first longitudinal beam, having a free end, bisects the at least one force sensor beam, and a second longitudinal beam has a free end facing the free end of the first longitudinal beam to define a gap therebetween. A support structure comprises a plurality of laterally extending beams disposed such that the second longitudinal beam bisects the plurality of laterally extending beams. Each of a pair of slots disposed at each of the free ends of the first and second longitudinal beams comprises a tapered portion leading to a generally longitudinal portion aligned with the central longitudinal beam. The slots provide a seat for a dogbone-shaped sample.

Microtesting Rig With Variable Compliance Loading Fibers For Measuring Mechanical Properties Of Small Specimens

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US Patent:
8297130, Oct 30, 2012
Filed:
Nov 12, 2009
Appl. No.:
12/617655
Inventors:
Robert Wheeler, IV - Hilliard OH, US
Paul A. Shade - Gallaway OH, US
Michael D. Uchic - Dayton OH, US
Assignee:
The United States of America as represented by the Secretary of the Air Force - Washington DC
International Classification:
G01N 3/08
US Classification:
73818
Abstract:
The present invention provides a microtesting rig for measuring mechanical properties of small specimens. The rig includes a microsized specimen positioned on a mounting block, an interchangeable contact tip connected with an actuator and configured for contact with the microsized specimen, and a magnifying imaging system for imaging the microsized specimen. The contact tip may be a fiber platen for compression testing or a fiber grip for tension testing.

Dual Function Indenter

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US Patent:
6978664, Dec 27, 2005
Filed:
Nov 17, 2003
Appl. No.:
10/713131
Inventors:
Michael Uchic - Centerville OH, US
Dennis Dimiduk - Bellbrook OH, US
Assignee:
The United States of America as represented by the Secretary of the Air Force - Washington DC
International Classification:
G01N003/34
US Classification:
73 85
Abstract:
A dual function indenter for use in a nanoindentation system is disclosed. The indenter of the present invention includes an indentation tip having a machined flat at its distal end forming a compression platen. A sharp imaging probe tip adjacent the machined flat extends parallel to the centerline axis of the indentation tip. The sharp imaging probe tip extends beyond the surface of the machined flat for in situ scanning/imaging of the sample surface.
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Michael D Uchic from Dayton, OH, age ~54 Get Report