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Naoki I Kanayama

from San Jose, CA
Age ~84

Naoki Kanayama Phones & Addresses

  • 7215 Shea Ct, San Jose, CA 95139 (408) 227-2385 (408) 332-9434
  • Shea Ct, San Jose, CA 95139
  • 6862 Santa Teresa Blvd, San Jose, CA 95119
  • 7191 Kodiak Ct, San Jose, CA 95139
  • Santa Clara, CA
  • 7215 Shea Ct, San Jose, CA 95139

Work

Position: Professional/Technical

Education

Degree: Graduate or professional degree

Business Records

Name / Title
Company / Classification
Phones & Addresses
Naoki I. Kanayama
Principal
Moritex USA Inc
Legal Services Office
7215 Shea Ct, San Jose, CA 95139

Publications

Us Patents

Pellet Conveying Device

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US Patent:
55991599, Feb 4, 1997
Filed:
Jun 6, 1995
Appl. No.:
8/470770
Inventors:
Kazuo Sugiura - Tokyo, JP
Yoshimitsu Hisajima - Tokyo, JP
Naoki Kanayama - San Jose CA
Assignee:
Kabushiki Kaisha Shinkawa - Tokyo
Shinkawa U.S.A., Inc. - Santa Clara CA
International Classification:
B66C 2300
US Classification:
4147443
Abstract:
A pellet conveying device used with a bonding machine for, for example, semiconductor devices, including a conveying arm that has a collet for holding pellets. The conveying arm can move vertically and pivot horizontally by two different driving sources so that the collet can be moved between predetermined two positions such as a pellet pick-up position and a pellet releasing position.

Wire Bend Inspection Method And Apparatus

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US Patent:
58189580, Oct 6, 1998
Filed:
Nov 25, 1996
Appl. No.:
8/758204
Inventors:
Hiromi Tomiyama - Tokyo, JP
Takeyuki Nakagawa - Tokyo, JP
Naoki Kanayama - San Jose CA
Assignee:
Kabushiki Kaisha Shinkawa - Tokyo
Shinkawa U.S.A., Inc. - Santa Clara CA
International Classification:
G06K 900
G01N 2100
H01L 2348
US Classification:
382145
Abstract:
A method and apparatus for inspecting bends in wires bonded between, for instance, pads of semiconductor chips and leads of lead frames using detection ranges established within imaging ranges in which images of bends are taken. Imaging range areas are established by dividing the distance between a first bonding point and a second bonding point of a target wire by the width of the detection range, and the wire bend is then detected in the respective imaging range areas.
Naoki I Kanayama from San Jose, CA, age ~84 Get Report