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Paul David Margozzi

from Morgan Hill, CA
Age ~64
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Also known as:
Paul D Margozzi, Paul J Margozzi, Paul P Margozzi, Paul Chur, Angelo Margozzi, Paul I
Phone and address:
19250 Cayenne Dr, Morgan Hill, CA 95037
(650) 248-9534
Related to:
Luis R Sanchez, 43Marietta Civitano, 64Sonja Civitano, 95John R Barrett, 71
Connected to:
Carolyn C Margraf, 85Linda S Margraf, 73Michael D Margraf, 59Rebecca Margraf, 33Elena Z Margrave, 116Melissa J Margrave, 43Benjamin A Margreiter, 35Miriam Margreiter, 50Brandon M Margreno, 42John Margres, 70

Paul Margozzi Phones & Addresses

  • 19250 Cayenne Dr, Morgan Hill, CA 95037 (650) 248-9534
  • 14722 Berry Way, San Jose, CA 95124 (408) 371-1416 (408) 377-2766
  • Mountain View, CA
  • 1357 Turnstone Way, Sunnyvale, CA 94087
  • Santa Clara, CA
  • 19250 Cayenne Dr, Morgan Hill, CA 95037

Work

Position: Professional/Technical

Education

Degree: Associate degree or higher

Emails

l***[email protected]

Resumes

Resumes

Paul Margozzi Photo 1

Director Of Cae & Design Automation - | Eda | Cad | New Product Development | Analog | Mix Signal | Soc

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Position:
Director of CAD & Design Automation at Intersil
Location:
Milpitas, California
Industry:
Semiconductors
Work:
Intersil since Aug 2006
Director of CAD & Design Automation
Semtech 2013 - 2013
Sr. Manager EDA - North America
Telcom Semiconductor and Microchip Technology Oct 1995 - Oct 2005
Dir of Engineering New Product Development
Media Vision Sep 1992 - Oct 1995
CAD & CAE Manager
National Semiconductor Feb 1982 - Sep 1992
CAD & CAE Manager
Interests:
Wine making and growing grapes :-), golf, music, good food and dancing
Paul Margozzi Photo 2

Paul Margozzi

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Publications

Us Patents

Environmental Box For Automated Wafer Probing

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US Patent:
47572558, Jul 12, 1988
Filed:
Mar 3, 1986
Appl. No.:
6/835137
Inventors:
Paul D. Margozzi - San Jose CA
Assignee:
National Semiconductor Corporation - Santa Clara CA
International Classification:
G01R 3500
G01R 3102
US Classification:
324158F
Abstract:
An automatic wafer probing system is disclosed as being located inside an environmental box filled with a positive pressure dry inert gas. The wafer to be probed is mounted on a Thermochuck that has a high thermal contact with the wafer. The chuck can be precisely heated or cooled over the temperature range of -60. degree. C. to +200. degree. C. An atmosphere of dry N. sub. 2 gas allows sub 0. degree. C. wafer probing without condensation on the wafer. The box is constructed of metal so as to shield any electromagnetic interferance that could possibly disrupt the testing procedure. A probe card produces probe contact with the chip circuits on the wafer and data taken at desired temperatures. The box includes a window that is in registry with the probe contacts and an externally mounted microscope looks through the window at the probe region. The wafer and window are rendered moisture free by dry N. sub. 2 gas.
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Paul David Margozzi from Morgan Hill, CA, age ~64 Get Report