US Patent:
20060161387, Jul 20, 2006
Inventors:
Alan Jowett - Redmond WA, US
Balaji Santhanam - Bellevue WA, US
Ravishankar Sathanur - Bellevue WA, US
Sivaprasad Padisetty - Redmond WA, US
Thirumalesh Bhat - Sammamish WA, US
Assignee:
Microsoft Corporation - Redmond WA
International Classification:
G21C 17/00
G06F 11/30
G06F 15/00
Abstract:
The invention provides a framework for collecting, storing, and analyzing system metrics concerning a computing system or a computer component. A configuration module is provided to configure settings specific to a metric. A data collection module is provided to collect metric data according to the settings in the configuration module and in one or more component specific plug-ins that extend and customize the framework according to specific needs of the component. The data collection module collects metrics at specified time intervals and periodically updates metric data stored in a central metrics storage module. An analysis module is provided to analyze metric data stored in the central metrics storage module online or offline. The analysis module may analyze a metric statistically or graphically, individually or combined with other metrics.