US Patent:
20050261838, Nov 24, 2005
Inventors:
Victor Andreev - Revere MA, US
Tomas Rejtar - Somerville MA, US
Barry Karger - Newton MA, US
International Classification:
G06F019/00
Abstract:
An improved system and method of analyzing sample data that increases the reliability of peak (compound) detection and identification in the presence of chemical and/or random noise. The sample analysis system includes a compound-separating unit for separating constituent compounds in a sample mixture, a compound-analyzing unit for identifying and quantitating at least one of the separated compounds, and a computer for acquiring data from the compound-separating and compound-analyzing units, for generating a multi-dimensional data set incorporating the acquired data, for executing an algorithm for reducing noise in the data set and for detecting peaks (compounds) in the noise-reduced data set, and for identifying/quantitating the detected compounds.
