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Hong Zhao Phones & Addresses

  • San Leandro, CA
  • Oakland, CA

Professional Records

Medicine Doctors

Hong Zhao Photo 1

Hong Zhao

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Specialties:
Hematology/Oncology
Work:
Salinas Valley Medical Clinic Cancer Care
505 E Romie Ln STE A, Salinas, CA 93901
(831) 755-1701 (phone), (831) 755-1702 (fax)
Languages:
English
Spanish
Description:
Dr. Zhao works in Salinas, CA and specializes in Hematology/Oncology. Dr. Zhao is affiliated with Salinas Valley Memorial Healthcare System.
Hong Zhao Photo 2

Hong Zhao

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Specialties:
Urology
Work:
University Of Virginia Hospital Urology
1300 Jefferson Park Ave STE 2, Charlottesville, VA 22903
(434) 924-2225 (phone)
Languages:
English
Spanish
Description:
Ms. Zhao works in Charlottesville, VA and specializes in Urology. Ms. Zhao is affiliated with University Of Virginia Medical Center.

Resumes

Resumes

Hong Zhao Photo 3

Director Of R And D

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Location:
790 Ridgeview Ter, Fremont, CA 94536
Industry:
Computer Software
Work:
Anova Solutions
Director of R and D

Cadence Design Systems Mar 2003 - Mar 2005
Architect

Simplex Solutions 1998 - 2003
Senior Engineer

Jpd Japan 1991 - 1998
Senior Software Engineer
Education:
Tsinghua University 1985 - 1990
Bachelors, Bachelor of Science, Design
National Tsing Hua University 1985 - 1990
Master of Science, Masters
Hong Zhao Photo 4

Hong Zhao

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Hong Zhao Photo 5

Hong Zhao

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Hong Zhao Photo 6

Hong Zhao

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Hong Zhao Photo 7

Hong Zhao

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Hong Zhao Photo 8

Hong Zhao

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Hong Zhao Photo 9

Hong Zhao

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Location:
United States
Hong Zhao Photo 10

Web Development Consultant/Specialist At Kaiser Permanente It

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Location:
San Francisco Bay Area
Industry:
Hospital & Health Care

Business Records

Name / Title
Company / Classification
Phones & Addresses
Hong Zhao
President
NEUTRINOSYS, INC
Business Services at Non-Commercial Site · Nonclassifiable Establishments
666 Msn Crk Ct, Fremont, CA 94539
Hong Zhao
Principal
Trinity Enterprise Inc
Business Services
3080 Alpine Ct, Fremont, CA 94555
Hong Zhao
President
SUN STAR INTERNATIONAL TRADING, INC
638 Broadway St, San Francisco, CA 94133
638 Broadway, San Francisco, CA 94133
Hong Zhao
President
DILANG INTERNATIONAL CORPORATION
3339 Judah St, San Francisco, CA 94122
Hong Gang Zhao
President
USA RED LUCK INT'L CHEMICAL GROUP INC
Hong Miao Zhao
President
SHENG EN CORPORATION
2214 S El Camino Real, San Mateo, CA 94403
Hong Zhao
President
FIRST TECHLINK, INC
666 Msn Crk Ct, Fremont, CA 94539
Hong Zhao
Trusource Service Consulting & Management, LLC
Provide Consulting Services to Manufactu · Business Consulting Services
6303 Owensmouth Ave, Woodland Hills, CA 91367
1511 Jefferson St, Oakland, CA 94612

Publications

Us Patents

High Accuracy Timing Model For Integrated Circuit Verification

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US Patent:
6721929, Apr 13, 2004
Filed:
May 11, 2001
Appl. No.:
09/854146
Inventors:
Jun Li - San Jose CA
Hong Zhao - Fremont CA
Assignee:
Cadence Design Systems, Inc. - San Jose CA
International Classification:
G06F 1750
US Classification:
716 6, 716 4, 716 5
Abstract:
A variable current source model accurately determines timing delays for designs of circuits implemented in integrated circuits. A design for an integrated circuit specifies a resistive-capacitive (âRCâ) network. The RC network couples a driving point and a receiving point, and a circuit specified in the design, drives the RC network at the driving point. The variable current source model determines driving currents for the circuit at the driving point based on the RC network and a characterization model of the circuit. A timing delay between the driving point and the receiving point is determined by simulating the drive of the RC network with the driving current at the driving point.

Method And System For Performing Crosstalk Analysis

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US Patent:
7073140, Jul 4, 2006
Filed:
Aug 29, 2003
Appl. No.:
10/651617
Inventors:
Jun Li - San Jose CA, US
Athanasius Spyrou - Sunnyvale CA, US
Hong Zhao - Fremont CA, US
Assignee:
Cadence Design Systems, Inc. - San Jose CA
International Classification:
G06F 17/90
US Classification:
716 4
Abstract:
Disclosed is an improved approach for performing crosstalk and signal integrity analysis in which multiple variables are taken into account when analyzing the effects of on-chip crosstalk, such as for example coupled wire length, ration of coupling capacitance, and aggressor and victim driver types. Rather than performing a full-chip simulation, the potential crosstalk effects can be pre-characterized by performing simulation/modeling over specific net portions by systematically changing the values of these multiple variables. A set of patterns characterized from the variables are formed from the modeling. During the analysis process, the IC design is checked of the presence of the patterns, from which is produced the expected delay impact for crosstalk in the design.

Method And System For Modeling Variation Of Circuit Parameters In Delay Calculation For Timing Analysis

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US Patent:
7310792, Dec 18, 2007
Filed:
Dec 15, 2004
Appl. No.:
11/014096
Inventors:
Nishath K. Verghese - Sunnyvale CA, US
Hong Zhao - Fremont CA, US
Assignee:
Cadence Design Systems, Inc. - San Jose CA
International Classification:
G06F 17/50
US Classification:
716 6, 716 4, 716 5
Abstract:
A system, method, and computer program accurately models circuit parameter variation for delay calculation. For any given circuit parameter value, a cell is characterized at just three values in the circuit parameter range. An interpolation process generates an equation to calculate delay using the characterization data from the three circuit parameter values. This delay equation calculates the delay for any value in the circuit parameter range. Similar methodology is used to model simultaneous variation of two circuit parameters. The cell is characterized at just six circuit parameter pairs to interpolate the delay equation for any circuit parameter pair in the characterized ranges. This methodology can be extended to accommodate variation of multiple circuit parameters using similar interpolation techniques.

Method And System For Performing Crosstalk Analysis

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US Patent:
7549134, Jun 16, 2009
Filed:
Jun 30, 2006
Appl. No.:
11/479279
Inventors:
Jun Li - San Jose CA, US
Athanasius Spyrou - Sunnyvale CA, US
Hong Zhao - Fremont CA, US
Assignee:
Cadence Design Systems, Inc. - San Jose CA
International Classification:
G06F 17/50
US Classification:
716 5, 716 4, 716 6
Abstract:
Disclosed is an improved approach for performing crosstalk and signal integrity analysis in which multiple variables are taken into account when analyzing the effects of on-chip crosstalk, such as for example coupled wire length, ratio of coupling capacitance, and aggressor and victim driver types. Rather than performing a full-chip simulation, the potential crosstalk effects can be pre-characterized by performing simulation/modeling over specific net portions by systematically changing the values of these multiple variables. A set of patterns characterized from the variables are formed from the modeling. During the analysis process, the IC design is checked of the presence of the patterns, from which is produced the expected delay impact for crosstalk in the design.

Method For Partitioning A Search Direction When Using Least Squares Reverse Time Migration

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US Patent:
20210239879, Aug 5, 2021
Filed:
Dec 15, 2020
Appl. No.:
17/247528
Inventors:
- Spring TX, US
Junzhe Sun - San Jose CA, US
Carey M. Marcinkovich - The Woodlands TX, US
Hong Zhao - Houston TX, US
Erik R. Neumann - Houston TX, US
International Classification:
G01V 99/00
G06F 30/20
G06F 17/18
Abstract:
A method for partitioning a search direction when using least squares reverse time migration (LSRTM) is provided. LSRTM may be used iteratively in order to improve imaging accuracy. As part of LSRTM, multiple local line searches may be performed. In particular, image space may be partitioned, such as by using a set of masks. The search direction, such as the gradient, may be partitioned using the set of masks. Local line searches may be performed for each partition of the search direction, resulting in finding respective line search constants. The respective line search constants may then be used for iterating the model in order to improve imaging accuracy.

Anode Assembly, Contact Strips, Electrochemical Cell, And Methods To Use And Manufacture Thereof

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US Patent:
20190345621, Nov 14, 2019
Filed:
Jul 26, 2019
Appl. No.:
16/523929
Inventors:
- Moss Landing CA, US
Ryan J. Gilliam - San Jose CA, US
Hong Zhao - Marina CA, US
International Classification:
C25B 9/04
B23K 20/08
C25B 9/18
C25B 9/08
C25B 13/04
C25B 1/46
C25B 11/02
B23K 26/34
Abstract:
Provided herein are anode assembly, conductive contact strips, electrochemical cells containing the anode assembly and the conductive contact strips, and methods to use and manufacture the same, where the anode assembly includes a plurality of V-shaped, U-shaped, or Z-shaped elements positioned outside the anode shell and in electrical contact with the anode.

Anode Assembly, Contact Strips, Electrochemical Cell, And Methods To Use And Manufacture Thereof

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US Patent:
20170342576, Nov 30, 2017
Filed:
May 25, 2017
Appl. No.:
15/605844
Inventors:
- Moss Landing CA, US
Ryan J. Gilliam - San Jose CA, US
Hong Zhao - Marina CA, US
International Classification:
C25B 9/04
B23K 26/34
C25B 9/18
C25B 9/08
C25B 13/04
C25B 11/02
B23K 20/08
C25B 1/46
B23K 103/14
B23K 101/38
B23K 103/12
B23K 103/16
Abstract:
Provided herein are anode assembly, conductive contact strips, electrochemical cells containing the anode assembly and the conductive contact strips, and methods to use and manufacture the same, where the anode assembly includes a plurality of V-shaped, U-shaped, or Z-shaped elements positioned outside the anode shell and in electrical contact with the anode.

On-Line Monitoring Of Process/System

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US Patent:
20170250428, Aug 31, 2017
Filed:
Feb 24, 2017
Appl. No.:
15/441704
Inventors:
- Moss Landing CA, US
Thomas A. Albrecht - Sunnyvale CA, US
Hong Zhao - Marina CA, US
Diego Martinez - Monterey CA, US
Rebecca L. King - Capitola CA, US
International Classification:
H01M 8/04992
H01M 8/04313
H01M 8/04791
Abstract:
Disclosed herein are methods and systems that relate to an on-line monitoring of a process/system by controlling rate of oxidation of metal ions at an anode in an anode electrolyte of an electrochemical process and controlling rate of reduction of the metal ions in a catalysis process to achieve steady state.

Isbn (Books And Publications)

Qing Bang: Qing Bang

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Author

Hong Zhao

ISBN #

7802141117

Hong X Zhao from San Leandro, CADeceased Get Report