Xiao Xie Phones & Addresses
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3262 Keith Ave, Castro Valley, CA 94546
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Hayward, CA
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Gardnerville, NV
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1180 Grace St, San Leandro, CA 94578 (510) 352-6113 (510) 895-9150
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San Lorenzo, CA
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Alameda, CA
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14960 Saturn Dr, San Leandro, CA 94578
Work
Position:
Food Preparation and Serving Related Occupations
Education
Degree:
High school graduate or higher
Business Records
Name / Title
Company / Classification
Phones & Addresses
Citizen General LLC
Auto Repair · Nonclassifiable Establishments
Auto Repair · Nonclassifiable Establishments
2222 E 12 St, Oakland, CA 94606
LIN'S GARDEN, INC
Principal
Ping Xie Xiao
Federal Credit Agency
Federal Credit Agency
825 Clay St, San Francisco, CA 94108
Publications
Us Patents
Image Sensor With Fast Intra-Frame Focus
View pageUS Patent:
20160373644, Dec 22, 2016
Filed:
Sep 2, 2016
Appl. No.:
15/256368
Inventors:
- Santa Clara CA, US
Eiichi Funatsu - San Jose CA, US
Donghui Wu - Sunnyvale CA, US
Zheng Yang - San Jose CA, US
Xiao Xie - Santa Clara CA, US
Eiichi Funatsu - San Jose CA, US
Donghui Wu - Sunnyvale CA, US
Zheng Yang - San Jose CA, US
Xiao Xie - Santa Clara CA, US
International Classification:
H04N 5/232
H04N 5/378
H04N 5/243
H04N 5/378
H04N 5/243
Abstract:
A method of focusing an image sensor includes scanning a first portion of an image frame from an image sensor a first time at a first rate to produce first focus data. A second portion of the image frame from the image sensor is scanned at a second rate to read image data from the second portion. The first rate is greater than the second rate. The first portion of the image frame is scanned a second time at the first rate to produce second focus data. The first focus data and the second focus data are compared, and the focus of a lens is adjusted in response to the comparison of the first focus data and the second focus data.
Image Sensor With Fast Intra-Frame Focus
View pageUS Patent:
20150365586, Dec 17, 2015
Filed:
Aug 25, 2015
Appl. No.:
14/835503
Inventors:
- Santa Clara CA, US
Eiichi Funatsu - San Jose CA, US
Donghui Wu - Sunnyvale CA, US
Zheng Yang - San Jose CA, US
Xiao Xie - Santa Clara CA, US
Eiichi Funatsu - San Jose CA, US
Donghui Wu - Sunnyvale CA, US
Zheng Yang - San Jose CA, US
Xiao Xie - Santa Clara CA, US
International Classification:
H04N 5/232
H04N 5/376
H04N 5/243
H04N 5/378
H04N 5/376
H04N 5/243
H04N 5/378
Abstract:
A method of focusing an image sensor includes scanning a first portion of an image frame from an image sensor a first time at a first rate to produce first focus data. A second portion of the image frame from the image sensor is scanned at a second rate to read image data from the second portion. The first rate is greater than the second rate. The first portion of the image frame is scanned a second time at the first rate to produce second focus data. The first focus data and the second focus data are compared, and the focus of a lens is adjusted in response to the comparison of the first focus data and the second focus data.
Image Sensor With Fast Intra-Frame Focus
View pageUS Patent:
20140340549, Nov 20, 2014
Filed:
Jul 25, 2013
Appl. No.:
13/950970
Inventors:
- Santa Clara CA, US
Eiichi Funatsu - Saratoga CA, US
Donghui Wu - Sunnyvale CA, US
Zheng Yang - San Jose CA, US
Xiao Xie - Santa Clara CA, US
Eiichi Funatsu - Saratoga CA, US
Donghui Wu - Sunnyvale CA, US
Zheng Yang - San Jose CA, US
Xiao Xie - Santa Clara CA, US
Assignee:
OMNIVISION TECHNOLOGIES, INC. - Santa Clara CA
International Classification:
H04N 5/335
US Classification:
348294
Abstract:
A method of focusing an image sensor includes scanning a first portion of an image frame from an image sensor a first time at a first rate to produce first focus data. A second portion of the image frame from the image sensor is scanned at a second rate to read image data from the second portion. The first rate is greater than the second rate. The first portion of the image frame is scanned a second time at the first rate to produce second focus data. The first focus data and the second focus data are compared, and the focus of a lens is adjusted in response to the comparison of the first focus data and the second focus data.